Semiconductor Testing & Prober Technology Insights | Application

Success Story – High-Power Device Characterization Application – Saudi Arabia

Customer Requirements: A University required a small footprint and flexible probing solution that would allow them to test 100 mm wafers, chips, and packaged ...

October 23, 2023

Success Story – Optoelectronics Device Characterization - Germany

Customer Requirements: Semiautomatic 300 mm Double Sided Probing (DSP) System to characterize several different types and sizes of silicon photonic devices in a ...

October 17, 2023

Success Story – Wafer Device Characterization - Singapore

Customer Device Characterization Requirements: A highly configurable 200 mm semiautomatic device characterization probe system that would interface to a Keysight ...

December 03, 2021

Success Story – Device Characterization Wafer Prober LA-100 - Canada

Customer Requirements: VentureLAB, a Canadian company located in Markham ON, started a new Hardware Initiative Lab to provide multiple measurement capabilities to ...

November 03, 2021

Success Story - Device Characterization - Canada

Customer Requirements: The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, partial ...

April 21, 2020

Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products

Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...

March 17, 2020

Success Story - High Frequency Wafer Probe Station Including RF Probes

Customer Requirements:...

January 08, 2020

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018