Semiconductor Testing & Prober Technology Insights

Fully Automatic Double-Sided Optoelectronics Wafer Test System - Success Story

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

Double - Sided Optoelectronics Wafer Test System - Success Story

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

Double-sided Optoelectronics Semiautomatic Wafer Prober  - Success Story

Customer Requirements:...

May 13, 2019

Turnkey Optoelectronic Probe and Test System with a Graphical User Interface (GUI)

Success Story – Canada Customer Requirements: Complete turnkey Semiautomatic Double-Sided Probing (DSP) System with Test Instrumentation for testing ...

August 28, 2018

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