Chip Trays for Wafer Probing Applications

May 15, 2026

Probing singulated and small die on wafer probing system chucks, analytical and production, is often challenging or not possible. Most chucks, ambient or thermal, mounted to probe systems, do not have vacuum hole patterns that make it easy to place and hold an individual die. The smaller the die size the more difficult this becomes.

Chip trays, similar in concept to a waffle pack, are often used to hold a single die or multiple die. In some cases, for Known Good Die (KGD) applications, multiple die are loaded and tested manually or automatically.

There are several ways to design a chip tray. The size of the tray depends on a few factors – the number of die the user wants to insert into the chip tray, the chuck size, and the wafer stage travel. They can be designed to hold one size or designed to be universal to hold different sized die. In most cases, the chip trays have a small hole in the bottom that allows the die to be held in place with the chuck vacuum. In some cases, mechanical clamping of the die is required. Chip trays can be conductive or non-conductive. They are often made with aluminum and are black anodized or nickel plated. Other materials and plating can be used. SemiProbe designs and manufactures a large family of chip trays for our single or double-sided probing systems.

Chip Trays for Wafer Probers

Chip Trays for Wafer Probing

Chip Trays for Wafer Probe Testing

Chip Trays

Chip Trays for Wafer Probing Applications

Chip Trays for Probe Testing

\Chip Trays for Probing Applications

New Call-to-action

 

Topics: Accessories

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
Find me on:
Semiconductor Wafer Testing Discovery Call

Subscribe to our email list.

SemiProbe Capabilities & Applications Guide for Wafer Characterization & Testing