Semiconductor Testing & Prober Technology Insights

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Device Characterization - Canada

Customer Requirements:  The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, ...

April 21, 2020

Success Story – Optoelectronics Wafer Probe Testing Application - Canada

Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...

April 20, 2020

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements:  The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story - Thermal RF MEMS Probe Station - United States

Customer Requirements: ...

April 01, 2020

Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products

 Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...

March 17, 2020

Success Story – RF Probe Station

Customer Requirements: A customer wanted to automatically test individual filters used for 5G applications. The requirement was for a fully automatic RF probe ...

March 05, 2020

Success Story – High Current Wafer Prober for Automotive Application

Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...

February 04, 2020

Success Story - High Frequency Wafer Probe Station Including RF Probes

Customer Requirements:...

January 08, 2020

Success Story- 300 mm High Power Wafer Probe Station

Customer Requirements:...

January 08, 2020

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