Semiconductor Testing & Prober Technology Insights

Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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Recent Posts

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Device Characterization - Canada

Customer Requirements:  The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, ...

April 21, 2020

Success Story – Optoelectronics Wafer Probe Testing Application - Canada

Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...

April 20, 2020

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements:  The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story - Thermal RF MEMS Probe Station - United States

Customer Requirements: ...

April 01, 2020

RF Wafer Probe Station

As a manufacturer of wafer probe systems,  we are often asked if we manufacture RF Wafer Probes, High Frequency Wafer Probes, Microwave Wafer Probes or mm Wave ...

March 31, 2020

Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products

 Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...

March 17, 2020

Success Story – RF Probe Station

Customer Requirements: A customer wanted to automatically test individual filters used for 5G applications. The requirement was for a fully automatic RF probe ...

March 05, 2020

Known Good Die (KGD) Probing Solutions

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February 16, 2020

Success Story – High Current Wafer Prober for Automotive Application

Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...

February 04, 2020

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