Semiconductor Manual Device Characterization – Canada

Customer Requirements:

A University in Canada was looking for a small footprint, manual, turn-key probing, and testing solution that would allow them to characterize semiconductor devices.

SemiProbe Manual Device Characterization Solution:

A manual Lab Assistant semiconductor probe device characterization system referred to as an LA-100 DC:

• 100 mm x 100 mm X & Y coaxial wafer stage with Z and theta
• 100 mm triaxial chuck with vacuum grooves and independent vacuum zones to handle die, partial wafers, and whole wafers up to 100 mm.
• A platen with a platen lift that accommodates individual manipulators or a probe card holder.
• A rigid microscope post with a 100 mm x 100 mm X, Y coaxial microscope movement with axes locking knobs.
• A compound optics zoom tube with objectives - 2x, 10x and 20x.
• CCTV System Kit - color camera with color monitor, cables, power supply, and a monitor stand
• Keithley 4200 Semiconductor Characterization System with rigid support shelf
• Four (4) manual MA-9000 manipulators with magnetic bases, triaxial probe arms, and Picoprobe active probe arms
• Assortment of tungsten probe tips
• Vibration Isolation Table (VIT_ with casters and leveling feet