---
title: Success Story – High Current Wafer Prober for Automotive Application
description: Learn about this high current wafer prober for automotive application.
---

[Semiconductor Testing & Prober Technology Insights ](https://blog.semiprobe.com)

# [Success Story – High Current Wafer Prober for Automotive Application](https://blog.semiprobe.com/high-current-wafer-prober)

 Written by [Denis Place](https://blog.semiprobe.com/author/denis-place) | February 04, 2020

**Customer Requirements:**

A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm wafers, chips and packaged parts up to 200 amps. Volume was low so a manual high current probe system with manual manipulators and a variety of high current (HC) and low voltage DC probe arms were desired. The high current probe system would get interfaced to a Keysight B1506. Due to the lethal voltage levels required to test the devices, a safety enclosure would be required.

*High Current Manual Prober with Dark Box Safety Enclosure*

**SemiProbe Solution:**

- LA-100 (100 mm) Lab Assistant manual high current probe system 
    - 100 mm wafer chuck with High Voltage (HC) and 3 KV triaxial force and sense connections
- Microscope Post with Coaxial X and Y Microscope Movement of 100 mm x 100 mm with locking knobs
- Compound Optics with CCTV System
- Two (2) MA-9100 manual manipulators with high current probe arms and one (1) MA-8005 with a coaxial DC probe arm
- Dark Box with door safety interlocks
- Interconnect Panel – contains standard coaxial, triaxial, and 3 KV HV (force and sense) triaxial connectors and adjustable rubberized boot for direct pass through of cables and Keysight boxes and safety interlock

*Manual Manipulators with High Current Probe Arms*

 

*High Current  and High Voltage Prober Interface Panel*

 

*High Current Probe System Ambient Chuck with High Current and Triaxial Kelvin Connections*

 

 

[View full post](https://blog.semiprobe.com/high-current-wafer-prober)

```json
{
  "@context" : "http://schema.org",
  "@type" : "BlogPosting",
  "author" : {
    "@type" : "Person",
    "name" : "Denis Place"
  },
  "dateModified" : "2020-05-05T11:48:22.436Z",
  "datePublished" : "2020-02-04T15:52:50Z",
  "headline" : "Success Story – High Current Wafer Prober for Automotive Application",
  "image" : {
    "@type" : "ImageObject",
    "height" : 118,
    "url" : "https://cdn2.hubspot.net/hubfs/3442595/HV%20Ford%20001.jpg",
    "width" : 158
  },
  "mainEntityOfPage" : "https://blog.semiprobe.com/high-current-wafer-prober",
  "publisher" : {
    "@type" : "Organization",
    "logo" : {
      "@type" : "ImageObject",
      "height" : 60,
      "url" : "/hs/hsstatic/content_shared_assets/static-1.4092/img/default-amp-logo.png",
      "width" : 60
    },
    "name" : "Semiconductor Wafer Prober Testing & Prober Technology Insights"
  }
}
```