---
title: Success Story – High Frequency Wafer Prober– SA8HF Load Pull - Canada 
description: A High Frequency Load Pull Wafer Probe Case Study
---

[Semiconductor Testing & Prober Technology Insights ](https://blog.semiprobe.com)

# [Success Story – High Frequency Wafer Prober– SA8HF Load Pull - Canada ](https://blog.semiprobe.com/high-frequency-wafer-prober-load-pull)

 Written by [Denis Place](https://blog.semiprobe.com/author/denis-place) | November 05, 2021

## Customer Requirements: 

VentureLAB, a Canadian company located in Markham ON, started a new Hardware Initiative Lab to provide multiple measurement capabilities to Canadian companies, start-ups to large companies. They wanted a semiautomatic probe system that allowed them to easily configure it to meet a variety of device characterization capabilities for testing die, partial wafers, whole wafers, and packaged parts at temperatures ranging from -65 C to 200 C. 

## SemiProbe High-Frequency Wafer Prober Solution for VentureLAB: 

Key System Components: 

- Probe System for Life PS4L SA-8 HF semiautomatic probe system consisting of: o Vibration Isolation Table (VIT) with casters and leveling feet 
- 200 mm Programmable X,Y,Z, and theta stage with control electronics 
- Load Stroke – for easy device loading and unloading 
- 200 mm thermal chuck system with triaxial addon surface and independent HF auxiliary chucks (2) that operates from -65 C to 200 C 
- Large Platen with stainless steel skin for magnetic-based manipulators, removable front wedge, and linear platen lift (coarse and fine) 
- Manipulators – four (4) manual MA-9000 with West/East and North/South HF, coaxial and triaxial probe arms 
- Adjustable Package Part Holder – includes mounting plate for the thermal chuck 
- Probe Card Holder 
- Localized Environmental Chamber (LEC) – with top-hat and LEC cover plate, provides a light tight, EMI, and frost-free environment 
- Microscope Post with microscope movement – coaxial and linear 100 mm X & Y travel 
- Fusion Zoom Tube Compound Optics with long working distance objectives 
- CCTV System – color camera, 24” color monitor and monitor stand 
- PC/Monitor/GPIB/Adjustable Monitor/Keyboard/Mouse Rack 
- PILOT Software Suite – Navigator, Wafer Map and Auto Align 
- Two (2) customized tuner mounts for Focus Microwave Multi-Purpose Tuners, model MPT-1818 that operate from 1.8 GHz to 18 GHz 
- Vacuum and Pressure Pumps – small footprint and quiet 

Probe Card Holder with a High Frequency Probe Card used with the  SemiProbe Semiautomatic SA-8 HF    Wafer Prober...

 

SemiProbe SA-8 HF prober system configured to test high-frequency devices at  low and high temperatures

 

Accessory - small footprint and quiet air compressor

 

 

Top Hat used with the Localized Environmental Chamber (LEC)  that provides  light and EMI shielding in a frost-free environment operating from -65 C to 200 C

 

Focus Microwave Multi-Purpose Tuner, Model MPT-1118, interfaced with the SemiProbe SA-8 semiautomatic probe system for High-Frequency measurements

 

 

Adjustable Packaged Part Holder

 

 

Multiple Views of SemiProbe SA-8 semiautomatic High Frequency wafer prober system configured with the Focus Microwave Multi-Purpose Tuners

 

SemiProbe SA-8 High-Frequency probe system with a Localized Environmental Chamber for -65C to 200 C temperature testing

 

High-Frequency Probe Arm and Probe used with SemiProbe Top Hat and Localized Environmental Chamber

 

 

[View full post](https://blog.semiprobe.com/high-frequency-wafer-prober-load-pull)

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