Semiconductor Testing & Prober Technology Insights

Success Story – High-Power – PS4L M-8 Wafer Prober - Finland

Written by Denis Place | May 15, 2026

 

 

Customer Requirements:

Customer was looking for a 200 mm manual prober that would test vertical and lateral devices up to 3 KV and over a temperature range of -40 C to 200 C. They required the probe system to be interfaced to a Keysight B1505 Parametric Analyzer

SemiProbe Solution: