Success Story – High-Power – PS4L M-8 Wafer Prober - Finland

May 15, 2026

 

 

Customer Requirements:

• Customer was looking for a 200 mm manual prober that would test vertical and lateral devices up to 3 KV and over a temperature range of -40 C to 200 C. They required the probe system to be interfaced to a Keysight B1505 Parametric Analyzer

SemiProbe Solution:

high-power wafer prober-1high-power wafer prober systemhigh-power wafer prober testinghigh-power wafer probe testinghigh-power wafer probermanual high-power wafer prober

Keithley Semiconductor Device Characterization Handbook

 

Topics: Application - High Power, Success Stories

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
Find me on:
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SemiProbe Capabilities & Applications Guide for Wafer Characterization & Testing