Semiconductor Testing & Prober Technology Insights

Success Story- 300 mm High Power Wafer Probe Station

Written by Denis Place | January 08, 2020

Customer Requirements:

  • The customer is involved with the CERN Program and required a flexible 300 mm semiautomatic system to test high voltage sensor arrays and a variety of other devices. The system would need high and low temperature capabilities. Manual manipulators with a few different standard as well as high voltage (HV) probe arms were required. The system needed the ability to test devices that ranged from 1 kV to 10 kV. The system would get interfaced to Keysight B1505 test instrumentation.

SemiProbe Solution:

  • A PS4L SA-12 (300 mm) semiautomatic probe system
    • A 305 mm x 305 mm programmable X,Y and Z wafer stage
    • A 300 mm thermal chuck with a triaxial HV addon surface that operated from -60 C to 200 C.
    • A localized environmental chamber (LEC) with a top hat
  • Compound Microscope Bridge with a 50 mm x 50 mm X and Y microscope movement and an 80 mm pneumatic Z lift
  • Compound Optics and CCTV System
  • PC/Monitors/Keyboard/with adjustable rack
  • PILOT Software Suite – Navigator, Wafer Map and Autoalign
  • Six (6) manual manipulators with a variety of probe arms – coax, triax and high voltage (3 kV and 10 kV)
  • Vibration Isolation Table (VIT) with a Laser Light Safety Curtain
  • Interlock Panel – mounted to the plexiglass cover and contains a variety of feedthroughs and safety interlock