---
title: Optoelectronic Wafer Prober VCSELS - Success Story
description: Multipurpose Semiautomatic Optoelectronics Wafer Test System
---

[Semiconductor Testing & Prober Technology Insights ](https://blog.semiprobe.com)

# [Optoelectronic Wafer Prober VCSELS - Success Story](https://blog.semiprobe.com/multipurpose-semiautomatic-optoelectronics-wafer-test-system-0)

 Written by [Denis Place](https://blog.semiprobe.com/author/denis-place) | May 13, 2019

Customer Requirements:

The customer wanted a 150 mm semiautomatic probe system to test vertical cavity surface-emitting laser diodes (VCSELS). The VCSELS were in wafer and individual die form and tested at temperatures ranging from 25 C to 200 C.  The customer required the device to be biased from the top and bottom.  A manual manipulator with a multi-contact DC wedge was used for biasing. A second manual manipulator was used  for a non-contact height measurement sensor. An optical fiber was required to collect the light and it needed to be mounted to a three-axis programmable manipulator with a goniometer.

 

 

SemiProbe Solution:

**Vertical Cavity Surface Emitting Laser Diodes (VCSELS)**

- SA-6 Semiautomatic Probe System 
    - 150 mm programmable X,Y,Z and Theta stage
    - PILOT Software Suite – Navigator, Wafer Map and Autoalign
    - Vibration Isolation Table with Test Instrumentation Rack
- 150 mm thermal chuck – ambient to 200 C
- PI three (3) axis programmable manipulator with goniometer used for fiber
- DC manipulator with multi-contact DC wedge
- Optical fiber arm with Non-Contact Height Measurement Sensor
- Zoom Tube optics with CCTV System

 To learn more about [Advanced Optoelectronic Wafer Probers Click Here.](https://blog.semiprobe.com/advanced-optoelectronics-wafer-prober-and-test-applications)

 

 

[View full post](https://blog.semiprobe.com/multipurpose-semiautomatic-optoelectronics-wafer-test-system-0)

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