Semiconductor Testing & Prober Technology Insights

Success Story - Optoelectronics Wafer Test System - VCSELS EELDS

Written by Denis Place | May 20, 2019

 

The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes (EELDS) on the same system using a single integrating sphere. The VCSELS would be in wafer form and the EELDS would be in laser bars.

 

Using our patented Probe System for Life (PS4L) Adaptive Architecture we configured a solution consisting of:

  • SA-6 Semiautomatic Probe System
    • 150 mm programmable X,Y,Z and theta stage
    • PILOT Software Suite – Navigator, Wafer Map and Autoalign
    • Vibration Isolation Table
  • Multi-Purpose gold plated chuck that allowed both VCSELS and EELDS to be mounted and held via vacuum
    • Individual vacuum fixation for the EELD devices/bars
  • Single Integrating Sphere used for both applications
    • Minimum changeover required to address both requirements – VCSELS and EELDS
  • Compound Optics with CCTV System
  • Manual Manipulators with coaxial probe arms and DC probe tips

 

 To learn about more advanced Optoelectronic Wafer Probers Click Here