---
title: Success Story - High Frequency Wafer Probe Station Including RF Probes
description: Probe Station for Life (PS4L) Semi Automatic High Frequency Wafer Probe Station by SemiProbe Including RF Probes
---

[Semiconductor Testing & Prober Technology Insights ](https://blog.semiprobe.com)

# [Success Story - High Frequency Wafer Probe Station Including RF Probes](https://blog.semiprobe.com/rf-probes)

 Written by [Denis Place](https://blog.semiprobe.com/author/denis-place) | January 08, 2020

**Customer Requirements: **

- The customer required a semiautomatic 200 mm probe system that would be used to probe a variety of rf (HF) devices up to 40 GHz. Wafer material could be either silicon or III-V compound. The system had to provide temperature capabilities that ranged from -60 C to 200 C. The devices would get contacted with rf probe cards, multi-contact wedges, rf probes and DC needles. Eight (8) manual manipulators were required – 4 HF and 4 DC with appropriate rf probe arms, rf probe tips and cables.

 

**SemiProbe Solution:**

- A PS4L SA-8 (200 mm) semiautomatic rf probe system 
    - 200 mm programmable X,Y,Z and theta stage with 200 mm load stroke and control electronics
    - A 200 mm gold plated thermal chuck with vacuum holes and two (auxiliary chucks) that operated from -60 C to 200 C
    - A localized environmental chamber (LEC) with a top hat to provide frost-free, dark and EMI shielding
    - Vibration Isolation Table (VIT)
- Compound Microscope Bridge with Compound Microscope Movement (50 mm of X and Y) and 50 mm of pneumatic Z
- Compound Optics and CCTV System
- PC/Monitors/Keyboard and Adjustable Rack
- PILOT Software Suite – Navigator, Wafer Map and Autoalign
- Eight (8) manual manipulators – 4 HF and 4 DC with HF and DC probe arms
- DC and RF probes and calibration substrates
- Air Compressor and Vacuum Pump

 

 

[View full post](https://blog.semiprobe.com/rf-probes)

```json
{
  "@context" : "http://schema.org",
  "@type" : "BlogPosting",
  "author" : {
    "@type" : "Person",
    "name" : "Denis Place"
  },
  "dateModified" : "2023-05-12T12:48:17.843Z",
  "datePublished" : "2020-01-08T15:48:11Z",
  "headline" : "Success Story - High Frequency Wafer Probe Station Including RF Probes",
  "image" : {
    "@type" : "ImageObject",
    "height" : 2353,
    "url" : "https://cdn2.hubspot.net/hubfs/3442595/HF%201-1.jpg",
    "width" : 2646
  },
  "mainEntityOfPage" : "https://blog.semiprobe.com/rf-probes",
  "publisher" : {
    "@type" : "Organization",
    "logo" : {
      "@type" : "ImageObject",
      "height" : 60,
      "url" : "/hs/hsstatic/content_shared_assets/static-1.4092/img/default-amp-logo.png",
      "width" : 60
    },
    "name" : "Semiconductor Wafer Prober Testing & Prober Technology Insights"
  }
}
```