Semiconductor Wafer Prober Testing & Prober Technology Insights
Success Story – 200 mm Semiautomatic Probe System for Magnet Stimulation and High-Voltage Measurements
Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation and high voltage measurements up to 3 ...
May 15, 2026Success Story – High-Power Device Characterization Application – Saudi Arabia
Customer Requirements: A University required a small footprint and flexible probing solution that would allow them to test 100 mm wafers, chips, and packaged ...
October 23, 2023Success Story - Vacuum Prober - United States
High Voltage Vacuum Prober Customer Requirements: A highly flexible, multi-purpose 300 mm manual vacuum probing system that would get used for device ...
December 08, 2020Success Story – High Power - Vacuum Wafer Probe Testing
Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...
April 23, 2020Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products
Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...
March 17, 2020Success Story – High Current Wafer Prober for Automotive Application
Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...
February 04, 2020Success Story - High Power Wafer Probe Station in a Dark Box
Customer Requirements:...
January 08, 2020