Semiconductor Wafer Prober Testing & Prober Technology Insights

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Success Story – High-Power Device Characterization Application – Saudi Arabia

Customer Requirements: A University required a small footprint and flexible probing solution that would allow them to test 100 mm wafers, chips, and packaged ...

October 23, 2023

Success Story - Vacuum Prober - United States

High Voltage Vacuum Prober Customer Requirements: A highly flexible, multi-purpose 300 mm manual vacuum probing system that would get used for device ...

December 08, 2020

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products

Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...

March 17, 2020

Success Story – High Current Wafer Prober for Automotive Application

Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...

February 04, 2020

Success Story- 300 mm High Power Wafer Probe Station

Customer Requirements:...

January 08, 2020

Success Story - High Power Wafer Probe Station in a Dark Box