Success Story – Dark Environment Device Characterization – United States
Customer Requirements:
A customer in the United States was looking for a small-footprint probing solution to characterize semiconductor devices inside a dark environment.
SemiProbe Solution:
A manual Lab Assistant probe system referred to as an LA-100 DC:
- 100 mm x 100 mm X & Y coaxial wafer stage with Z and theta
- 100 mm chuck with vacuum grooves and independent vacuum zones to handle die, partial wafers, and whole wafers up to 100 mm.
- A platen with a platen lift that accommodates individual manipulators or a probe card holder.
- A rigid microscope post with a 100 mm x 100 mm X, Y coaxial microscope movement with axis locking knobs.
- A stereo zoom microscope with a long working distance (WD) and large field of view (FOV).
- CCTV System Kit - color camera with color monitor, cables, and power supply
- Four (4) manual MA-8000 manipulators with magnetic bases and coaxial probe arms.
- Assortment of tungsten probe tips
- Dark Box with interconnect panel – coaxial feed-throughs and a rubberized boot for direct cable pass-through
Success Story – Dark Environment Device Characterization – United States
