802.860.7000
802.860.7000

Semiconductor Testing & Prober Technology Insights

Success Story - Device Characterization - Canada

Customer Requirements:  The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, ...

April 21, 2020

Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products

 Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...

March 17, 2020

Success Story - High Frequency Wafer Probe Station Including RF Probes

Customer Requirements:...

January 08, 2020

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018
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