Semiconductor Testing & Prober Technology Insights

Success Story – Dark Environment Device Characterization – United States

Success Story – Dark Environment Device Characterization – United States Customer Requirements: A customer in the United States was looking for a small-footprint ...

July 29, 2024

Success Story – Manual Device Characterization Application – Canada

Semiconductor Manual Device Characterization – Canada Customer Requirements: A University in Canada was looking for a small footprint, manual, turn-key probing, ...

July 29, 2024

Success Story – High-Power Device Characterization Application – Saudi Arabia

Customer Requirements: A University required a small footprint and flexible probing solution that would allow them to test 100 mm wafers, chips, and packaged ...

October 23, 2023

Success Story – Magnetic Stimulation – United States

Customer Requirements: A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and ...

October 03, 2021

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements: The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story – High Current Wafer Prober for Automotive Application

Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...

February 04, 2020

Success Story - High Power Wafer Probe Station in a Dark Box

Customer Requirements:...

January 08, 2020

Success Story - MEMS Manual Wafer Prober

Customer Requirements: The customer wanted to test 200 mm silicon MEMS wafers using a manual probe system integrated with a Polytec MSA-500 MEMS Motion Analyzer. ...

June 25, 2019

Success Story - Double - Sided Optoelectronics Wafer Test System

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

Success Story - Bournes Automotive Sensor Testing System for Failure Analysis

Success Story-Mexico & USA Customer: Bourns De Mexico - http://www.bourns.com...

August 28, 2018