Semiconductor Testing & Prober Technology Insights

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements:  The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story – High Current Wafer Prober for Automotive Application

Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...

February 04, 2020

Success Story - High Power Wafer Probe Station in a Dark Box

Customer Requirements:...

January 08, 2020

Success Story - MEMS Manual Wafer Prober

Customer Requirements:...

June 25, 2019

Success Story - Double - Sided Optoelectronics Wafer Test System

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

Success Story - Bournes Automotive Sensor Testing System for Failure Analysis

Success Story-Mexico & USA Customer:  Bourns De Mexico - http://www.bourns.com...

August 28, 2018

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018

Success Story - Custom Optoelectronic Wafer Probe Test System

Success Story - USA When a major defense contractor needed a custom platform to test advanced optoelectronic components, the PS4L (Probe System for Life) provided ...

August 28, 2018

International Microwave Symposium 2018

Going to the International Microwave Symposium 2018?...

May 17, 2018

The Probe System for Life Family

The PS4L family of wafer probing systems is based on SemiProbe’s patented Adaptive Architecture. Unlike traditional probe systems, all foundation modules – bases, ...

May 08, 2018

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