Customer Requirements:
A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and Spintronic wafers and small samples.
- Ability to test small samples and whole wafers up to 100 mm
- Six (6) DC manipulators for bias
- Magnet to generate a vertical magnetic field
SemiProbe Solution:
Integrated LA-100 Magnetic Stimulation Prober System
Manual Manipulators with GMW Magnet
Key System Components:
- Lab Assistant Probing System: LA-100 with coarse and fine wafer stage, platen, carrier plate holder, microscope post, microscope movement (100 mm x 100 mm X & Y), CCTV System and monitor stand
- Interchangeable carrier plates to hold wafers and small samples
- GMW 5201 Horizontal Projected Field Electromagnet mounted to an X,Y, Z, and theta stage
- Cooling Unit – used to cool the magnet
- Power Supply
- Six (6) MA-8005 manipulators with vacuum bases, adjustable probe arm face plates, coaxial probe arms and probe tips
- Vibration Isolation Table
