Semiconductor Wafer Prober Testing & Prober Technology Insights

Success Story – Magnetic Stimulation – United States

October 03, 2021

Customer Requirements:

A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and Spintronic wafers and small samples.

  •   Ability to test small samples and whole wafers up to 100 mm
  •   Six (6) DC manipulators for bias
  •   Magnet to generate a vertical magnetic field

SemiProbe Solution:

Magnetic Stimulation Prober System

 Integrated LA-100 Magnetic Stimulation Prober System 

Magnetic Prober Manual Manipulators with GMW Magnet

Manual Manipulators with GMW Magnet

Key System Components:

  •   Lab Assistant Probing System: LA-100 with coarse and fine wafer stage, platen, carrier plate holder, microscope post, microscope movement (100 mm x 100 mm X & Y), CCTV System and monitor stand
  •   Interchangeable carrier plates to hold wafers and small samples
  •   GMW 5201 Horizontal Projected Field Electromagnet mounted to an X,Y, Z, and theta stage
  •   Cooling Unit – used to cool the magnet
  •   Power Supply
  •   Six (6) MA-8005 manipulators with vacuum bases, adjustable probe arm face plates, coaxial probe arms and probe tips
  •   Vibration Isolation Table 

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Topics: Application - Magnetic Stimulation, Success Stories, Manual Systems

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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