Semiconductor Wafer Prober Testing & Prober Technology Insights

Success Story – Magnetic Stimulation – United States

Customer Requirements: A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and ...

October 03, 2021

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements: The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018
Semiconductor Wafer Testing Discovery Call

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