Semiconductor Wafer Prober Testing & Prober Technology Insights

Government Lab - Multi-purpose 200 mm Semi-Automatic Magnetic Stimulation Probe System

Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation measurements. The contact to the device ...

May 15, 2026

Success Story – 200 mm Semiautomatic Probe System for Magnet Stimulation and High-Voltage Measurements

Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation and high voltage measurements up to 3 ...

May 15, 2026

Success Story – Magnetic Stimulation – United States

Customer Requirements: A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and ...

October 03, 2021

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements: The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018
Semiconductor Wafer Testing Discovery Call

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