Semiconductor Testing & Prober Technology Insights

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements:  The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018

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