Semiconductor Testing & Prober Technology Insights

Semiautomatic Optoelectronics Wafer Test System - Success Story - Light Emitting Diodes

May 20, 2019

The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames or rings, as partial wafers and as individual die. The device would be biased with a DC manipulator and the light output would be captured by an integrating sphere. The integrating sphere needed to be moved in and out of position on a repeatable basis when required.


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Light Emitting Diodes (LEDS)

  • SA-6 Semiautomatic Probe System
    • 150 mm programmable X,Y,Z and theta stage
    • PILOT Software Suite – Navigator, Wafer Map and Autoalign
    • Vibration Isolation Table
  • Standard (non-thermal) 150 mm wafer chuck and customized holders for frames, rings and die
  • Ability to test whole wafers, partial wafers, individual die and wafers sawn & stretched on rings or frames
  • Integrating Sphere mounted on a manually moved retractable stage
  • Manual Manipulator with coaxial probe arm and DC probe tip

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 To learn more about Advanced Optoelectronic Wafer Probers Click Here

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Topics: Optoelectronics, Advanced Probe System

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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