Success Story – Optoelectronics Device Characterization - Germany
Customer Requirements: Semiautomatic 300 mm Double Sided Probing (DSP) System to characterize several different types and sizes of silicon photonic devices in a ...
October 17, 2023Semiconductor Wafer Prober Testing & Prober Technology Insights
New Trends & Challenges with Optoelectronic Probing
The never ending quest for more capable optoelectronic devices are challenging the prober companies to develop new methods of holding, integrating products and ...
December 08, 2020Success Story – Optoelectronics Wafer Probe Testing Application - Canada
Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...
April 20, 2020Success Story - Semiautomatic Optoelectronics Wafer Test System - Light Emitting Diodes
The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...
May 20, 2019Success Story - Optoelectronics Wafer Test System - VCSELS EELDS
The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...
May 20, 2019Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System
The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...
May 13, 2019Success Story - Double - Sided Optoelectronics Wafer Test System
The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...
May 13, 2019Success Story - Optoelectronics Fully Automated Wafer Prober- MEMS
Customer Requirements: The customer wanted a fully automatic probe system to test silicon photonic devices in wafer form that were manufactured using MEMS ...
May 13, 2019