Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...
Customer Requirements: The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, partial ...
Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...
Customer Requirements: The customer wanted to test 200 mm silicon MEMS wafers under vacuum. They wanted the ability to test at low and high temperatures (-60 C to ...
The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...
