Semiconductor Testing & Prober Technology Insights

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Device Characterization - Canada

Customer Requirements:  The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, ...

April 21, 2020

Success Story – Optoelectronics Wafer Probe Testing Application - Canada

Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...

April 20, 2020

Success Story - Thermal RF MEMS Probe Station - United States

Customer Requirements: ...

April 01, 2020

Success Story - High Frequency Wafer Probe Station Including RF Probes

Customer Requirements:...

January 08, 2020

Success Story- 300 mm High Power Wafer Probe Station

Customer Requirements:...

January 08, 2020

Success Story - MEMS Semiautomatic Wafer Prober - Vacuum Prober - Thermal Chuck

Customer Requirements:...

May 28, 2019

Success Story - Optoelectronic Wafer Prober - LEDS

Customer Requirements:...

May 20, 2019

Success Story - Semiautomatic Optoelectronics Wafer Test System - Light Emitting Diodes

The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...

May 20, 2019

Success Story - Optoelectronics Wafer Test System - VCSELS EELDS

  The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...

May 20, 2019

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