Customer Requirements: • A university wanted a 150 mm semiautomatic, multi-purpose, double-sided probing (DSP) system to test a variety of optoelectronic devices ...
May 15, 2026Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation measurements. The contact to the device ...
May 15, 2026Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation and high voltage measurements up to 3 ...
May 15, 2026Turnkey and Integrated 200 mm Semiautomatic Probe System with an Olympus Metallurgical Microscope for a large Wafer Foundry...
October 04, 2021Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...
April 23, 2020Customer Requirements: The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, partial ...
April 21, 2020Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...
April 20, 2020Customer Requirements:...
April 01, 2020Customer Requirements:...
January 08, 2020