Success Story – Europe

Optoelectronic Probe System with Thorlabs Multi-Axis Programmable Manipulators

Customer Requirements:

• Manual Double Sided Probing System (DSP) for testing optoelectronic devices in die and module form.
• Manual loading and un-loading of the device
• The system had to be configured to electrically stimulate from the top of the device and optically stimulate and detect from the side of the device.
• The manual three axis manipulators were placed on the top platen.
• The programmable multi-axis optical manipulators were located underneath the top platen and placed on the bottom side platen.
• The devices were heated and cooled with a thermal electric cooler (TEC).
• DC and HF Probes are used.

SemiProbe Solution:

Top Vier of DUT holder and fiber

DUT holder with fiber and HF probe mounts 

Programmable Manipulator with fiber mounted on bottom platen.

Key System Components:

• Probe System for Life (PS4L) M-4 manual probe system with Rapid Align wafer stage that includes coarse and fine X, Y, Z and theta.
• Double Sided Prober (DSP) platen assembly to support two (2) programmable Thorlabs manipulators and three (3) manual manipulators with customized High Frequency probe arms
• Manual microscope with zoom tube optics with a CCTV System
• Customized TEC thermal system with integrated thermocouples for temperature feedback
• Customized device holder

 To learn more about Advanced Optoelectronic Wafer Probers Click Here.