Semiconductor Wafer Prober Testing & Prober Technology Insights

Success Story – Optoelectronics Device Characterization - Germany

Customer Requirements: Semiautomatic 300 mm Double Sided Probing (DSP) System to characterize several different types and sizes of silicon photonic devices in a ...

October 17, 2023

Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

Success Story - Double - Sided Optoelectronics Wafer Test System

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

Success Story - Double-sided Optoelectronics Semiautomatic Wafer Prober

Customer Requirements:...

May 13, 2019

Success Story - Optoelectronics Double Sided Probing System

Success Story – Europe Optoelectronic Probe System with Thorlabs Multi-Axis Programmable Manipulators Customer Requirements: Manual Double Sided Probing System ...

August 28, 2018

Turnkey Optoelectronic Probe and Test System with a Graphical User Interface (GUI)

Success Story – Canada Customer Requirements: Complete turnkey Semiautomatic Double-Sided Probing (DSP) System with Test Instrumentation for testing ...

August 28, 2018
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