Success Story – Small-Footprint, Double-Sided Optoelectronics Wafer Prober

May 15, 2026

Customer Requirements:

A customer in the United States was looking for a customized and small-footprint, double-sided probing system to test optoelectronic devices in an environmental chamber.

SemiProbe Solution:

• A manual Lab Assistant probe system referred to as an LA-150

• 150 mm x 150 mm X & Y coaxial wafer stage with Z and theta

• 150 mm DSP chuck carrier plate with mechanical clamping.

• A platen with a platen lift that accommodates individual manipulators or a probe card holder.

• A small environmental chamber that provided access to the device backside when using a customer supplied light detector and test instrumentation.

• A rigid microscope post with a 100 mm x 100 mm X, Y coaxial microscope movement with axis locking knobs.

• A stereo zoom microscope with a long working distance (WD) and large field of view (FOV).

• CCTV System Kit - color camera with color monitor, cables, and power supply

• Four (4) manual MA-9000 manipulators with magnetic bases and coaxial probe arms.

• Assortment of tungsten probe tips

Small Footprint Double-Sided Optoelectronics Wafer Prober

 

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Topics: Application - Optoelectronics, Success Stories, Manual Systems

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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