- The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that could be moved in X, Y, Z and theta. The device would be contacted from the top with up to five (5) manual three-axis manipulators with coaxial probe arms and DC probes while being stimulated by the magnet located beneath the device. The customer needed the ability to test the devices from the top at temperature ranging from ambient to 225 C.
Turnkey Integrated Magnetic Stimulation System - Manual Prober with Temperature Testing Capability
SemiProbe Wafer Probe Testing Solution:
Thermal Probe System with DC Manipulators
Magnet is Located Beneath the Device Under Test (DUT)