Semiconductor Testing & Prober Technology Insights

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

April 14, 2020

Customer Requirements: 

  • The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that could be moved in X, Y, Z and theta. The device would be contacted from the top with up to five (5) manual three-axis manipulators with coaxial probe arms and DC probes while being stimulated by the magnet located beneath the device. The customer needed the ability to test the devices from the top at temperature ranging from ambient to 225 C.

Magnetic Stimulation Wafer Probe System

Turnkey Integrated Magnetic Stimulation System - Manual Prober with Temperature Testing Capability

SemiProbe Wafer Probe Testing Solution: 

Wafer Probe Testing with Magnetic Stimulation

Magnetic Stimulation Wafer Probe Testing Solution

Thermal Probe System with DC Manipulators

 

Magnet is Located Beneath the Wafer Device Under Test

Magnet is Located Beneath the Device Under Test (DUT)

 

Learning more about our advanced Wafer Probe Testing Systems and Solutions and the advantages of the PS4L modular Wafer Probe Testing Systems approach.

 

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Topics: Application - Magnetic Stimulation, Success Stories, Manual Systems

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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