Semiconductor Testing & Prober Technology Insights

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Success Story - MEMS Semiautomatic Wafer Prober - Vacuum Prober - Thermal Chuck

Customer Requirements:...

May 28, 2019

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