Success Story – 200 mm Semiautomatic Probe System for Magnet Stimulation and High-Voltage Measurements

May 15, 2026

Customer Requirements:

A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation and high voltage measurements up to 3 KV. The contact to the device under test (DUT) was with manual manipulators configured with low and high-voltage triaxial probe arms.

SemiProbe Solution:

• PS4L SA-8 Semiautomatic Probe System with a programmable X, Y, Z, and theta with control electronics

• Integrated GMW Model 5203 Vertical Projected Field Electromagnet with power supply, recirculating water chiller and Hall Effect Calibration Kit

• Interchangeable carrier plates for MSS measurement application – whole wafers and individual die

• 100 mm 3KV chuck with triaxial kelvin connections

• Eight (8) manual manipulators with low and high voltage triaxial probe arms

• Dark Box with remote light source, interconnect panel with low and high voltage feedthroughs and safety interlock system

• Vibration Isolation Table with adjustable monitor/keyboard and mouse rack

 

Semi-Automatic Magnetic Stimulation Wafer Probe System

Semi-Automatic Magnetic Stimulation Wafer Prober

 

Semi-Automatic Magnetic Stimulation Wafer Probe

Keithley Semiconductor Device Characterization Handbook

 

Topics: Application - High Power, Application - Magnetic Stimulation, Success Stories, Semi-Automatic Systems

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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SemiProbe Capabilities & Applications Guide for Wafer Characterization & Testing