Semiconductor Testing & Prober Technology Insights

Success Story - Device Characterization - Canada

April 21, 2020

Customer Requirements: 

The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, partial wafers and individual die. They needed a semiautomatic probe system that had double-sided probing (DSP) capabilities. The device would be stimulated from the top with a probe card or individual manipulators and the backside would have a detector mounted on a programmable X,Y and Z stage to collect the light output. The environment had to be dark and the devices needed to be tested at temperatures ranging from ambient to 225 C. The customized graphical user interface (GUI) had to control the prober  and test instrumentation as well as collect the data.

SemiProbe Solution:

Device Characterization SystemDevice Characterization System

Silicon Photonics

  • Turn-Key Double-Sided Probing (DSP) System with Test Instrumentation to characterize optoelectronic devices over temperature
  • Semiautomatic 200 mm Probe System
    • 200 mm programmable X,Y,Z and theta stage
    • PILOT Software Suite – Navigator, Wafer Map and Autoalign
    • Customized Graphical User Interface (GUI)
  • Top side probing with manipulators or probe card and bottom side light detection with detector
  • Carriers for wafers, partial wafers and individual die
  • Thermal System – ambient to 225 C 
  • Programmable coarse and fine stage for optical detector
  • Dark Box, interconnect panels and a Vibration Isolation Table

Optoelectronic Device Characterization at Temperature - Double-Sided Probing ApplicationOptoelectronic Device Characterization at Temperature - Double-Sided Probing Application

 

Device Characterization Wafer Carrier-  Double-Sided Probing

Device Characterization Wafer Carrier-  Double-Sided Probing

 

Device Characterization  Wafer Carrier - Individual Die - Double-Sided Probing

Device Characterization  Wafer Carrier - Individual Die - Double-Sided Probing

 

Device Characterization Wafer Carrier - Partial Wafer - Double-Sided ProbingDevice Characterization Wafer Carrier - Partial Wafer - Double-Sided Probing

 

To learn more about Advanced Optoelectronic Wafer Probers Click Here.

Learning more about our advanced Wafer Probe Testing Systems and Solutions and the advantages of the PS4L modular Wafer Probe Testing Systems approach.

 

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Topics: Application - Device Characterization, Success Stories, Semi-Automatic Systems

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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