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The World's Most Modular Wafer Probe Testing System

We know Capital Equipment is Expensive

 

Often when specifying a wafer probe testing system you'll have one shot at getting your capital expenditure approved. Then you have to live with the testing system you buy for many years...

 

About Us:

Started in 2006 by semiconductor industry veterans with over 70 years of experience using, designing and building probe systems

Worldwide Customer Base – Universities, Government Labs and Corporations

 

The Problem:

As semiconductor industry veterans we’ve often seen how unanticipated testing changes required the purchase of a new system. The majority of the probe systems manufactured:

Have no or a limited upgrade path – example - increases in stage travel and chuck size often require a new system

Are single purpose systems with little flexibility

Are not designed to be upgraded in the field

 

Why not invest in the world's most modular wafer probe testing system that adapts cost-effectively to your needs over time?

Introducing the Wafer Probe System for Life (PS4L)

The Solution:

Designed and patented a more modular probe system platform called the Probe System for Life (PS4L) 

PS4L is a family of manual, semiautomatic, fully automatic and specialty probe systems with interchangeable components that allows a customer to start with a system that meets their application and budget and perpetually field upgrade it when their requirements change

Upgrades are performed at the customer location and at a fraction of the cost in comparison to purchasing a new system

Upgrade cost significantly reduced with a generous module upgrade program

 

Wafer Probe Testing Equipment Lifecycle

 The PS4L Wafer Probe Testing Perpetual Field Upgrade Path

 

PS4L Systems – can be field upgraded when your application and requirements change

Manual Probe Systems can be field upgraded to Semiautomatic Probe Systems

Semiautomatic Probe Systems can be field upgraded to larger travel Semiautomatic Probe Systems

Semiautomatic Probe Systems can be field upgraded to Fully Automatic Probe Systems

Fully Automatic Probe Systems can be field upgraded to larger travel Fully Automatic Probe Systems

 

Modules

Modules can be added when required

Modules can be initially sold as an integrated application specific probe system or added to your existing system at a later date when your requirements change

Modules are added at the customer site at a fraction of the cost in comparison to a new system

New modules convert single purpose probing systems to multi-purpose probing systems

 

Wafer Probe Testing Modules

The World's First Fully Modular, Field Upgradable Wafer Testing Systems

 

Accessories and Features can be added when required

Many to select from that are application specific – dark boxes, light curtains, vibration isolation tables, chucks, manipulators, probe arms, probe tips, cables, connectors, probe card holders, packaged part holders, optics, CCTV systems, vacuum pumps, air compressors, chip trays, carrier plates, instrument racks and much more

 

Wafer Probe Testing Accessories

Wafer Probe Testing Field Upgradable Features

 

Interested in Learning More?

 

Request a Discovery Call

 

Patented PS4L Architecture Advantages

Modular in design – purchase what you need now, add new capabilities when required

All key building blocks provide selection choices – base, stage, chuck, platen, microscope mount & movement, optics and accessories

Can be configured as a single or multi-application system

Designed to be perpetually field upgraded

Generous module upgrade program significantly reduces the upgrade cost - you trade in your existing module that you don’t need at a prorated depreciation and apply it to your new module(s), saving significant budget.

Systems, Modules and Accessories to meet a wide range of Applications:

Device Characterization

RF/High Frequency/Microwave - Get the RF Wafer Probe Testing Guide

High Power - Get the High Power Wafer Probe Testing Guide

Optoelectronics - Get the Optoelectronics Wafer Probe Testing Guide

MEMS - Get the MEMS Wafer Probe Testing Guide

PCB, Displays, Substrates

Automated Systems - Get the Wafer Probe Testing Automation Guide

 

Did you know that on the same PS4L Platform you can also test:

Individual Die

Partial Wafers

Whole Wafers

Frames - Sawn and Stretched

Packaged Parts

Substrates

Printed Circuit Boards and More...

 

Just Getting Started on Your Wafer Prober Selection Journey? Get the Guide!

 

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PS4L Wafer Prober Testing Systems Testing Capabilities

SemiProbe provides basic through advanced application specific wafer probe systems that meet the diversified needs of research to production:

 

Device Characterization Wafer Probe Systems - 
Learn about Device Characterization and Failure Analysis on Whole Wafers, Partial Wafers and Individual Die Success Story

 

Device Characterization SystemDevice Characterization Wafer Probe Testing Solutions

 


Optoelectronic Wafer Probe Systems
Learn about Optoelectronic Wafer Probe LEDS Success Story

 

Wafer Probe Testing - Optoelectronics

Optoelectronics Wafer Probe Testing Solutions - LED

 


MEMS Wafer Probe Systems
Learn About Fully Automatic Wafer Probe - MEMS Success Story

Wafer Probe Testing - MEMS

MEMS Wafer Probe Testing Solutions - Semiautomatic and Fully Automatic Versions

 


High Frequency (including Microwave, RF, mmWave) Wafer Probe Systems
Learn About High Frequency RF Wafer Probe Testing Here

 

Wafer Probe Testing - RF - Microwave - High Frequency

High Frequency - RF - Wafer Probe Testing Solutions

 

Interested in seeing how we compare?

Request a Quote

 


High Power Wafer Probe Systems
Learn About 300 mm High Power Wafer Probe Station Success Story

 

Wafer Probe Testing - High Power

High Power Wafer Probe Testing Solutions

 


Magnetic Stimulation Wafer Probe Systems
Learn About Magnetic Stimulation Wafer Characterization Probe System Success Story

 

Wafer Probe Testing - Magnetic Stimulation

Magnetic Stimulation Wafer Probe Testing Solutions

 


Vacuum Wafer Probe Systems
Learn About Fully Automated Vacuum Probe System for Testing MEMS Wafers up to 150 mm Success Story

 

Wafer Probe Testing - Vacuum

Vacuum Wafer Probe Testing Solutions

 


Low and High Temperature Wafer Probe Systems - Thermal Shock
Learn About Thermal RF MEMS - Semiautomatic Wafer Probe Testing System - Thermal Chuck Success Story

 

Wafer Probe Testing - High Temperature - Low Temperature - Thermal Shock

Low and High Temperature Wafer Probe Testing Solutions

 


Double-sided Wafer Probe Systems
Learn About Fully Automatic 300 mm Double-Sided Optoelectronics Wafer Probe  System Success Story

 

Wafer Probe Testing - Double-sided

Double Sided Wafer Probe Testing Solutions

 


Multi-Functional Wafer Probe Systems
Learn About Multi-Functional Wafer Probe Solution - MEMS, High Frequency & Optoelectronics Success Story

 

Wafer Probe Testing - Multi-functional

Multi-Functional Wafer Probe Testing Solutions

Known Good Die (KGD) Wafer Probe Testing
Learn about SemiProbe Known Good Die Wafer Probe Testing Here.

Known Good Die - KGD - Wafer Probe Testing

Known Good Die (KGD) Wafer Probe Testing Solutions

 

Let's Chat!

 

Semiconductor Wafer Testing Discovery Call

Software

Pilot Control Software Suite

The SemiProbe PILOT Control software Suite for SemiProbe semiautomatic and fully automatic probe systems also employs the SemiProbe patented adaptive architecture.  Software modules can be added to the base system as needed. PILOT Control Software consists of a Microsoft Windows-based user interface built on the SemiServer application for communicating to and from the probe system.  Individual customer applications can be integrated with PILOT Control Software for a more customized system to meet individual needs. 


PILOT Control Software comes with standard modules including Navigator and Position Matrix with more sophisticated options like the  Wafer Map and Vision module available. Modules interfacing to the SemiServer have a set of remote commands that can be accessed by any other module, providing the capability to perform its own specific function, yet access all other features of the suite seamlessly.  Full driver libraries are available for LabView, C++, and Visual Basic with specific instrument drivers to support the most advanced instrumentation available. Communications may be made using RS-232, GPIB or TCP/IP, enabling the system to be either a controller or a slave in an integrated solution.

How to buy an analytical probe station

Not Ready for a PS4L system? Need an Entry Level Wafer Prober? Meet the Lab Assistant!

Lab Assistant - Entry Level, Small Footprint Manual Wafer Probe Systems

Success Story SemiProbe Lab Assistant - Company. 

 

Wafer Probe Testing - Manual

Lab Assistant Wafer Probe System - 50 mm to 200 mm versions

 

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