Semiconductor Testing & Prober Technology Insights

Success Story - Double-sided Optoelectronics Semiautomatic Wafer Prober

May 13, 2019

Customer Requirements:

The customer wanted a turn-key probing and testing system to test optoelectronic devices. They needed to test whole wafers, partial wafers and individual die. They needed a semiautomatic probe system that had double-sided probing (DSP) capabilities. The device would be stimulated from the top with a probe card or individual manipulators and the backside would have a detector mounted on a programmable X,Y and Z stage to collect the light output. The environment had to be dark and the devices needed to be tested at temperatures ranging from ambient to 225 C. The customized graphical user interface (GUI) had to control the prober  and test instrumentation as well as collect the data.

Double-sided Optoelectronics Semiautomatic Wafer Prober                                   Double-sided Optoelectronics Semiautomatic Wafer Prober

Double-sided Optoelectronics Semiautomatic Wafer Prober - Thermal Wand

 Thermal Wand

INdividual Die Carrier for Double-sided Optoelectronics Semiautomatic Wafer Prober

Individual Die Carrier 

Partial Wafer Carrier for Double-sided Optoelectronics Semiautomatic Wafer Prober

 Partial Wafer Carrier

Wafer Carrier for Double-sided Optoelectronics Semiautomatic Wafer Prober

Wafer Carrier 

 Solution:

  • Turn-Key Double-Sided Probing (DSP) System with Test Instrumentation
  • Semiautomatic 200 mm Probe System 200 mm programmable X,Y,Z and theta stage
    • PILOT Software Suite – Navigator, Wafer Map and Autoalign
    • Customized Graphical User Interface (GUI)
  • Top side probing with manipulators or probe card and bottom side light detection with detector
  • Carriers for wafers, partial wafers and individual die
  • Thermal System – ambient to 225 C
  • Programmable coarse and fine stage for optical detector
  • Dark Box, interconnect panels and a Vibration Isolation Table               

To learn more about other Advanced Optoelectronic Wafer Probers Click Here.

 

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Topics: Application - Optoelectronics, Application - Double-Sided, Success Stories, Semi-Automatic Systems

Author: Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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