Semiconductor Wafer Prober Testing & Prober Technology Insights
Chip Trays for Wafer Probing Applications
Probing singulated and small die on wafer probing system chucks, analytical and production, is often challenging or not possible. Most chucks, ambient or thermal, ...
May 15, 2026University 150 mm Semi-Automatic, Multi-Purpose, Double-Sided, Optoelectronic Probing System
Customer Requirements: • A university wanted a 150 mm semiautomatic, multi-purpose, double-sided probing (DSP) system to test a variety of optoelectronic devices ...
May 15, 2026Government Lab - Multi-purpose 200 mm Semi-Automatic Magnetic Stimulation Probe System
Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation measurements. The contact to the device ...
May 15, 2026Success Story – 200 mm Semiautomatic Probe System for Magnet Stimulation and High-Voltage Measurements
Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation and high voltage measurements up to 3 ...
May 15, 2026Success Story – Small-Footprint, Double-Sided Optoelectronics Wafer Prober
Customer Requirements: A customer in the United States was looking for a customized and small-footprint, double-sided probing system to test optoelectronic ...
May 15, 2026Success Story – Wafer Level Reliability – Germany
Customer Requirements: •A large MEMS company required a 300 mm manual probe system that operated up to 400 C for Wafer Level Reliability (WLR) applications. The ...
May 15, 2026Success Story – High Frequency Wafer Prober System - Denmark
Customer Requirements: • Multi-Purpose manual probing solution for die, partial wafers, wafers up to 200 mm and wafers mounted on frames. • Vibration Isolation ...
May 15, 2026Ultimate Guide to Wafer Probe Station Probes
Contacting your Semiconductor Device to make electrical measurements using probe tips, multi-contact wedges and probe cards One of the main purposes of a probe ...
February 26, 2026Success Story – Dark Environment Device Characterization – United States
Success Story – Dark Environment Device Characterization – United States Customer Requirements: A customer in the United States was looking for a small-footprint ...
July 29, 2024