Customer Requirements: • Customer was looking for a 200 mm manual prober that would test vertical and lateral devices up to 3 KV and over a temperature range of ...
Probing singulated and small die on wafer probing system chucks, analytical and production, is often challenging or not possible. Most chucks, ambient or thermal, ...
Customer Requirements: • A university wanted a 150 mm semiautomatic, multi-purpose, double-sided probing (DSP) system to test a variety of optoelectronic devices ...
Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation measurements. The contact to the device ...
Customer Requirements: • A Government Lab wanted a multi-purpose 200 mm semiautomatic probe system for magnet stimulation and high voltage measurements up to 3 ...
Customer Requirements: A customer in the United States was looking for a customized and small-footprint, double-sided probing system to test optoelectronic ...
Customer Requirements: •A large MEMS company required a 300 mm manual probe system that operated up to 400 C for Wafer Level Reliability (WLR) applications. The ...
Customer Requirements: • Multi-Purpose manual probing solution for die, partial wafers, wafers up to 200 mm and wafers mounted on frames. • Vibration Isolation ...
Contacting your Semiconductor Device to make electrical measurements using probe tips, multi-contact wedges and probe cards One of the main purposes of a probe ...
