Semiconductor Testing & Prober Technology Insights

Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Fully Automatic Wafer Prober - MEMS

Customer Requirements:...

July 16, 2019

MEMS Manual Wafer Prober

Customer Requirements:...

June 25, 2019

MEMS Semiautomatic Wafer Prober - Vacuum Prober - Thermal Chuck

Customer Requirements:...

May 28, 2019

Join SemiProbe at the International Microwave Symposium (IMS) 2019 - Boston Convention Center

Look for SemiProbe at Booth #594...

May 21, 2019

Fully Automatic Wafer Prober - Success Story - MEMS

Customer Requirements:...

May 21, 2019

Optoelectronic Wafer Prober Success Story - LEDS

Customer Requirements:...

May 20, 2019

Semiautomatic Optoelectronics Wafer Test System - Success Story - Light Emitting Diodes

The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...

May 20, 2019

Optoelectronics Wafer Test System - Success Story - VSCELS EELEDS

  The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...

May 20, 2019

Fully Automatic Double-Sided Optoelectronics Wafer Test System - Success Story

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

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