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Customer Device Characterization Requirements: A highly configurable 200 mm semiautomatic device characterization probe system that would interface to a Keysight ...
High-Frequency Wafer Prober Customer Requirements: Customer was looking for a general-purpose 200 mm manual high-frequency wafer probe system that allowed for ...
Customer Requirements: A semiautomatic probe system is used for production testing of 150 mm and 200 mm MEMS wafers using probe cards, a dispensing system, and a ...
Customer Requirements: Fully automatic vacuum probing system for testing 150 mm and 200 mm MEMS wafers in a production environment. The system had to operate at ...
High Frequency Wafer Prober Application - Customer Requirements: The customer wanted a modular manual probe system to characterize 150 mm and 200 mm wafers and ...
