Semiconductor Wafer Prober Testing & Prober Technology Insights

New Product - A Family of Programmable Micropositioners

SemiProbe today announced a new family of programmable micropositioners that can be used on any probe system. Historically the programmable manipulator could only ...

August 31, 2021

New Product - A Family of mini-PS4L Wafer Probe Stations

SemiProbe today announced a new family of small footprint wafer probe systems specifically focused on small sample or package part testing. The mini-PS4L series ...

August 31, 2021

Success Story – MEMS Prober System - Taiwan

SemiProbe provided a turnkey and Integrated 200 mm Semiautomatic MEMS Probe System with an Olympus Metallurgical Microscope for a large Wafer Foundry. Customer ...

July 28, 2021

About Semiconductor Wafer Probe Test Environmental Test Chambers

Quite often we get asked if we build test chambers. ...

December 15, 2020

Fully Automatic Wafer Prober - Success Story - MEMS

Customer Requirements:...

December 10, 2020

Success Story - Vacuum Prober - United States

High Voltage Vacuum Prober Customer Requirements:  A highly flexible, multi-purpose 300 mm manual vacuum probing system that would get used for device ...

December 08, 2020

New Trends & Challenges with Optoelectronic Probing

The never ending quest for more capable optoelectronic devices are challenging the prober companies to develop new methods of holding, integrating products and ...

December 08, 2020

A New Family of Programmable Probe Station Micromanipulator

SemiProbe Introduces a New Family of Programmable Probe Station Micromanipulators that can be Used on any Probe System. Historically the programmable probe ...

September 22, 2020

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Device Characterization - Canada

Customer Requirements:  The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, ...

April 21, 2020

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