Semiconductor Wafer Prober Testing & Prober Technology Insights

Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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Recent Posts

International Microwave Symposium 2018

Going to the International Microwave Symposium 2018?...

May 17, 2018

Analytical Probe Station System Checklist

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May 09, 2018

Wafer Sort

Wafer sort or sorting can be performed in a few different ways using analytical or production probing systems. Analytical probers are available in manual, ...

April 03, 2018

Vibration Isolation Tables

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February 13, 2018

Differences Between a Wafer Prober and a Wafer Probe System for Life (PS4L)

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January 29, 2018

Introduction to Hot Chucks

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January 09, 2018

Thermal Shock Chamber and Localized Environmental Chamber Introduction

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December 21, 2017

Converting a Semiautomatic Probe System to a Fully Automatic Probe System

Until recently, upgrading probe systems was a difficult and strenuous process that could not be done in the field. Today, some manufacturers have created ...

November 28, 2017

An Introduction to Probe Cards

What are probe cards and when are they used with a probe system?...

November 21, 2017

How Does a Wafer Handler Integrate Into a Fully Automated Probe Station?

Integrating wafer handlers to create a fully automated probe station can be challenging and having a basic understanding of the process is extremely helpful....

November 21, 2017
Semiconductor Wafer Testing Discovery Call

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