Semiconductor Wafer Prober Testing & Prober Technology Insights

Fully Automatic Wafer Prober - Success Story - MEMS

Customer Requirements:...

December 10, 2020

A New Family of Programmable Probe Station Micromanipulator

SemiProbe Introduces a New Family of Programmable Probe Station Micromanipulators that can be Used on any Probe System. Historically the programmable probe ...

September 22, 2020

Success Story – RF Probe Station

Customer Requirements: A customer wanted to automatically test individual filters used for 5G applications. The requirement was for a fully automatic RF probe ...

March 05, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Success Story - Fully Automatic Wafer Prober - MEMS

Customer Requirements:...

July 16, 2019

Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

Success Story - Optoelectronics Fully Automated Wafer Prober- MEMS

Customer Requirements: The customer wanted a fully automatic probe system to test silicon photonic devices in wafer form that were manufactured using MEMS ...

May 13, 2019

The Probe System for Life Family

The PS4L family of wafer probing systems is based on SemiProbe’s patented Adaptive Architecture. Unlike traditional probe systems, all foundation modules – bases, ...

May 08, 2018

Differences Between a Wafer Prober and a Wafer Probe System for Life (PS4L)

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January 29, 2018

Converting a Semiautomatic Probe System to a Fully Automatic Probe System

Until recently, upgrading probe systems was a difficult and strenuous process that could not be done in the field. Today, some manufacturers have created ...

November 28, 2017
Semiconductor Wafer Testing Discovery Call

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