Semiconductor Testing & Prober Technology Insights

Success Story – RF Probe Station

Customer Requirements: A customer wanted to automatically test individual filters used for 5G applications. The requirement was for a fully automatic RF probe ...

March 05, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Success Story - Fully Automatic Wafer Prober - MEMS

Customer Requirements:...

July 16, 2019

Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

Success Story - Optoelectronics Fully Automated Wafer Prober- MEMS

Customer Requirements:...

May 13, 2019

The Probe System for Life Family

The PS4L family of wafer probing systems is based on SemiProbe’s patented Adaptive Architecture. Unlike traditional probe systems, all foundation modules – bases, ...

May 08, 2018

Differences Between a Wafer Prober and a Wafer Probe System for Life (PS4L)

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January 29, 2018

Converting a Semiautomatic Probe System to a Fully Automatic Probe System

Until recently, upgrading probe systems was a difficult and strenuous process that could not be done in the field. Today, some manufacturers have created ...

November 28, 2017

How Does a Wafer Handler Integrate Into a Fully Automated Probe Station?

Integrating wafer handlers to create a fully automated probe station can be challenging and having a basic understanding of the process is extremely helpful....

November 21, 2017

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