Success Story – Manual Device Characterization Application – Canada
Semiconductor Manual Device Characterization – Canada Customer Requirements: A University in Canada was looking for a small footprint, manual, turn-key probing, ...
July 29, 2024Semiconductor Wafer Prober Testing & Prober Technology Insights
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Success Story – High-Power Device Characterization Application – Saudi Arabia
Customer Requirements: A University required a small footprint and flexible probing solution that would allow them to test 100 mm wafers, chips, and packaged ...
October 23, 2023Success Story – Optoelectronics Device Characterization - Germany
Customer Requirements: Semiautomatic 300 mm Double Sided Probing (DSP) System to characterize several different types and sizes of silicon photonic devices in a ...
October 17, 2023Wentworth Wafer Probers - Wentworth Wafer Probe Systems and Consumables Cross Reference
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January 13, 2022Success Story – Wafer Device Characterization - Singapore
Customer Device Characterization Requirements: A highly configurable 200 mm semiautomatic device characterization probe system that would interface to a Keysight ...
December 03, 2021Success Story – High Frequency Wafer Prober - China
High-Frequency Wafer Prober Customer Requirements: Customer was looking for a general-purpose 200 mm manual high-frequency wafer probe system that allowed for the ...
December 01, 2021