Semiconductor Wafer Prober Testing & Prober Technology Insights

Success Story – Wafer Level Reliability – Germany

Customer Requirements: •A large MEMS company required a 300 mm manual probe system that operated up to 400 C for Wafer Level Reliability (WLR) applications. The ...

May 15, 2026

Success Story – Fully Automatic MEMS Vacuum Prober System - Taiwan

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January 21, 2023

Success Story – MEMS Microfluidics Wafer Probe System Application – United States 

Customer Requirements: A semiautomatic probe system is used for production testing of 150 mm and 200 mm MEMS wafers using probe cards, a dispensing system, and a ...

November 15, 2021

Success Story – MEMS Wafer Probe Test System - South Korea

Customer Requirements: Fully automatic vacuum probing system for testing 150 mm and 200 mm MEMS wafers in a production environment. The system had to operate at ...

November 11, 2021

Success Story – Taiwan - MEMS Semiautomatic Wafer Prober

Turnkey and Integrated 200 mm Semiautomatic Probe System with an Olympus Metallurgical Microscope for a large Wafer Foundry...

October 04, 2021

Success Story – MEMS Prober System - Taiwan

SemiProbe provided a turnkey and Integrated 200 mm Semiautomatic MEMS Probe System with an Olympus Metallurgical Microscope for a large Wafer Foundry. Customer ...

July 28, 2021

Fully Automatic Wafer Prober - Success Story - MEMS

Customer Requirements:...

December 10, 2020

Success Story - Thermal RF MEMS Probe Station - United States

Customer Requirements:...

April 01, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Success Story - Fully Automatic Wafer Prober - MEMS

Customer Requirements:...

July 16, 2019
Semiconductor Wafer Testing Discovery Call

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