Semiconductor Wafer Prober Testing & Prober Technology Insights

Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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Recent Posts

About Semiconductor Wafer Probe Test Environmental Test Chambers

Quite often we get asked if we build test chambers....

December 15, 2020

Fully Automatic Wafer Prober - Success Story - MEMS

Customer Requirements:...

December 10, 2020

Success Story - Vacuum Prober - United States

High Voltage Vacuum Prober Customer Requirements: A highly flexible, multi-purpose 300 mm manual vacuum probing system that would get used for device ...

December 08, 2020

New Trends & Challenges with Optoelectronic Probing

The never ending quest for more capable optoelectronic devices are challenging the prober companies to develop new methods of holding, integrating products and ...

December 08, 2020

A New Family of Programmable Probe Station Micromanipulator

SemiProbe Introduces a New Family of Programmable Probe Station Micromanipulators that can be Used on any Probe System. Historically the programmable probe ...

September 22, 2020

Success Story – High Power - Vacuum Wafer Probe Testing

Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...

April 23, 2020

Success Story - Device Characterization - Canada

Customer Requirements: The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, partial ...

April 21, 2020

Success Story – Optoelectronics Wafer Probe Testing Application - Canada

Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...

April 20, 2020

Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe

Customer Requirements: The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...

April 14, 2020

Success Story - Thermal RF MEMS Probe Station - United States

Customer Requirements:...

April 01, 2020
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