Semiconductor Wafer Prober Testing & Prober Technology Insights

Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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Recent Posts

RF Wafer Probe Station

As a manufacturer of wafer probe systems, we are often asked if we manufacture RF Wafer Probes, High Frequency Wafer Probes, Microwave Wafer Probes or mm Wave ...

March 31, 2020

Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products

Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...

March 17, 2020

Success Story – RF Probe Station

Customer Requirements: A customer wanted to automatically test individual filters used for 5G applications. The requirement was for a fully automatic RF probe ...

March 05, 2020

Known Good Die (KGD) Probing Solutions

There are a number of ways to test whole silicon wafers in production. In most cases all die on the wafer are tested and this is often referred to as 100% probe, ...

February 16, 2020

Success Story – High Current Wafer Prober for Automotive Application

Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...

February 04, 2020

Success Story - High Frequency Wafer Probe Station Including RF Probes

Customer Requirements:...

January 08, 2020

Success Story- 300 mm High Power Wafer Probe Station

Customer Requirements:...

January 08, 2020

Success Story - High Power Wafer Probe Station in a Dark Box

Customer Requirements:...

January 08, 2020

Leasing Option for SemiProbe Probe Systems

Leasing Options for Purchasing Analytical Probe Systems...

January 08, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019
Semiconductor Wafer Testing Discovery Call

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