Customer Requirements: Semiautomatic 300 mm Double Sided Probing (DSP) System to characterize several different types and sizes of silicon photonic devices in a ...
The never ending quest for more capable optoelectronic devices are challenging the prober companies to develop new methods of holding, integrating products and ...
Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...
The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...
The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...
The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...
The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...
Customer Requirements: The customer wanted a fully automatic probe system to test silicon photonic devices in wafer form that were manufactured using MEMS ...
