Customer Requirements: A customer in the United States was looking for a customized and small-footprint, double-sided probing system to test optoelectronic ...
Customer Requirements: •A large MEMS company required a 300 mm manual probe system that operated up to 400 C for Wafer Level Reliability (WLR) applications. The ...
Customer Requirements: • Multi-Purpose manual probing solution for die, partial wafers, wafers up to 200 mm and wafers mounted on frames. • Vibration Isolation ...
Success Story – Dark Environment Device Characterization – United States Customer Requirements: A customer in the United States was looking for a small-footprint ...
Semiconductor Manual Device Characterization – Canada Customer Requirements: A University in Canada was looking for a small footprint, manual, turn-key probing, ...
Customer Requirements: A University required a small footprint and flexible probing solution that would allow them to test 100 mm wafers, chips, and packaged ...
Customer Requirements: A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and ...
Customer Requirements: The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...
Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...
