Semiconductor Wafer Prober Testing & Prober Technology Insights

Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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Recent Posts

Leasing Option for SemiProbe Probe Systems

Leasing Options for Purchasing Analytical Probe Systems...

January 08, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Success Story - Fully Automatic Wafer Prober - MEMS

Customer Requirements:...

July 16, 2019

Success Story - MEMS Manual Wafer Prober

Customer Requirements: The customer wanted to test 200 mm silicon MEMS wafers using a manual probe system integrated with a Polytec MSA-500 MEMS Motion Analyzer. ...

June 25, 2019

Success Story - MEMS Semiautomatic Wafer Prober - Vacuum Prober - Thermal Chuck

Customer Requirements: The customer wanted to test 200 mm silicon MEMS wafers under vacuum. They wanted the ability to test at low and high temperatures (-60 C to ...

May 28, 2019

Join SemiProbe at the International Microwave Symposium (IMS) 2019 - Boston Convention Center

Look for SemiProbe at Booth #594...

May 21, 2019

Success Story - Optoelectronic Wafer Prober - LEDS

Customer Requirements:...

May 20, 2019

Success Story - Semiautomatic Optoelectronics Wafer Test System - Light Emitting Diodes

The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...

May 20, 2019

Success Story - Optoelectronics Wafer Test System - VCSELS EELDS

The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...

May 20, 2019

Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019
Semiconductor Wafer Testing Discovery Call

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