Semiconductor Wafer Prober Testing & Prober Technology Insights

Denis Place

Denis Place is one of the founders of SemiProbe and has more than 35 years of experience working in the international semiconductor industry. He has degrees in electrical engineering and business management. Place is in a unique position, because he personally used and worked with probing systems for many years before starting his own semiconductor probing company.
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Recent Posts

Success Story - Double - Sided Optoelectronics Wafer Test System

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

Success Story - Optoelectronics Fully Automated Wafer Prober- MEMS

Customer Requirements: The customer wanted a fully automatic probe system to test silicon photonic devices in wafer form that were manufactured using MEMS ...

May 13, 2019

Success Story - Double-sided Optoelectronics Semiautomatic Wafer Prober

Customer Requirements:...

May 13, 2019

Optoelectronic Wafer Prober VCSELS - Success Story

Customer Requirements:...

May 13, 2019

Success Story - Semiautomatic Vacuum Probing System- MEMS - China

Success Story – Vacuum Prober – China Customer Requirements:...

November 01, 2018

Success Story - Multi-Functional Wafer Probing Solution - MEMS, High Frequency & Optoelectronics

Success Story – Optoelectronics - Europe Custom Optoelectronic Test System - Vtt (Finland) Customer Requirements: Fully Automatic Electro-Optical probing system ...

August 28, 2018

Success Story - Bournes Automotive Sensor Testing System for Failure Analysis

Success Story-Mexico & USA Customer: Bourns De Mexico - http://www.bourns.com...

August 28, 2018

Success Story - Optoelectronics Double Sided Probing System

Success Story – Europe Optoelectronic Probe System with Thorlabs Multi-Axis Programmable Manipulators Customer Requirements: Manual Double Sided Probing System ...

August 28, 2018

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018

Turnkey Optoelectronic Probe and Test System with a Graphical User Interface (GUI)

Success Story – Canada Customer Requirements: Complete turnkey Semiautomatic Double-Sided Probing (DSP) System with Test Instrumentation for testing ...

August 28, 2018
Semiconductor Wafer Testing Discovery Call

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