Semiconductor Testing & Prober Technology Insights

Success Story - High Power Wafer Probe Station in a Dark Box

Customer Requirements:...

January 08, 2020

Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm

Success Story – MEMS – United States Customer Requirements:...

July 23, 2019

Success Story - Fully Automatic Wafer Prober - MEMS

Customer Requirements:...

July 16, 2019

Success Story - MEMS Manual Wafer Prober

Customer Requirements:...

June 25, 2019

Success Story - MEMS Semiautomatic Wafer Prober - Vacuum Prober - Thermal Chuck

Customer Requirements:...

May 28, 2019

Success Story - Optoelectronic Wafer Prober - LEDS

Customer Requirements:...

May 20, 2019

Success Story - Semiautomatic Optoelectronics Wafer Test System - Light Emitting Diodes

The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...

May 20, 2019

Success Story - Optoelectronics Wafer Test System - VCSELS EELDS

  The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...

May 20, 2019

Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

Success Story - Double - Sided Optoelectronics Wafer Test System

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

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