Success Story – MEMS Wafer Probe Test System - South Korea
Customer Requirements: Fully automatic vacuum probing system for testing 150 mm and 200 mm MEMS wafers in a production environment. The system had to operate at ...
November 11, 2021Semiconductor Wafer Prober Testing & Prober Technology Insights
Success Story – High Frequency Wafer Prober Application – United States
High Frequency Wafer Prober Application - Customer Requirements: The customer wanted a modular manual probe system to characterize 150 mm and 200 mm wafers and ...
November 08, 2021Success Story – High Frequency Wafer Prober– SA8HF Load Pull - Canada
Customer Requirements: VentureLAB, a Canadian company located in Markham ON, started a new Hardware Initiative Lab to provide multiple measurement capabilities to ...
November 05, 2021Success Story – Device Characterization Wafer Prober LA-100 - Canada
Customer Requirements: VentureLAB, a Canadian company located in Markham ON, started a new Hardware Initiative Lab to provide multiple measurement capabilities to ...
November 03, 2021Success Story – High Frequency Wafer Probe - Canada
Customer Requirements: The customer wanted a small footprint, a multi-purpose probing system configured with DC and HF frequency manipulators that could probe ...
October 27, 2021Success Story – Taiwan - MEMS Semiautomatic Wafer Prober
Turnkey and Integrated 200 mm Semiautomatic Probe System with an Olympus Metallurgical Microscope for a large Wafer Foundry...
October 04, 2021Success Story – Magnetic Stimulation – United States
Customer Requirements: A University was looking for a small footprint manual probing solution that would allow them to characterize a variety of MRAM and ...
October 03, 2021Success Story – MEMS Prober System - Taiwan
SemiProbe provided a turnkey and Integrated 200 mm Semiautomatic MEMS Probe System with an Olympus Metallurgical Microscope for a large Wafer Foundry. Customer ...
July 28, 2021Success Story – High Power - Vacuum Wafer Probe Testing
Customer Requirements: The customer wanted a wafer probe testing solution to test a variety of wafers ranging in size from 100 mm to 200 mm at high voltages in a ...
April 23, 2020