Success Story - Device Characterization - Canada
Customer Requirements: The customer wanted a turn-key probing and testing system to characterize optoelectronic devices. They needed to test whole wafers, partial ...
April 21, 2020Semiconductor Wafer Prober Testing & Prober Technology Insights
Success Story – Optoelectronics Wafer Probe Testing Application - Canada
Customer Requirements: The customer wanted a semiautomatic wafer probe testing system to test high power edge emitting laser diodes (EELD) in laser bar form. ...
April 20, 2020Success Story – Magnetic Stimulation Wafer Probe Testing System – Europe
Customer Requirements: The customer wanted to use a manual wafer probe testing system to test 150 mm MRAM wafers using a magnet placed underneath the device that ...
April 14, 2020Success Story - Thermal RF MEMS Probe Station - United States
Customer Requirements:...
April 01, 2020Success Story - Semiconductor Device Characterization and Failure Analysis on High Power Analog Amplifier Products
Success Story - USA When a leading innovator of integrated circuits, hybrids and modules used in industrial and aerospace applications that require high-power ...
March 17, 2020Success Story – RF Probe Station
Customer Requirements: A customer wanted to automatically test individual filters used for 5G applications. The requirement was for a fully automatic RF probe ...
March 05, 2020Success Story – High Current Wafer Prober for Automotive Application
Customer Requirements: A USA automotive manufacturer required a small footprint and flexible high current probing solution that would allow them to test 100 mm ...
February 04, 2020Success Story - High Frequency Wafer Probe Station Including RF Probes
Customer Requirements:...
January 08, 2020Success Story - High Power Wafer Probe Station in a Dark Box
Customer Requirements:...
January 08, 2020