Success Story - Fully Automated Vacuum Probing System for Testing MEMS wafers up to 150 mm
Success Story – MEMS – United States Customer Requirements:...
July 23, 2019Semiconductor Wafer Prober Testing & Prober Technology Insights
Success Story - MEMS Manual Wafer Prober
Customer Requirements: The customer wanted to test 200 mm silicon MEMS wafers using a manual probe system integrated with a Polytec MSA-500 MEMS Motion Analyzer. ...
June 25, 2019Success Story - MEMS Semiautomatic Wafer Prober - Vacuum Prober - Thermal Chuck
Customer Requirements: The customer wanted to test 200 mm silicon MEMS wafers under vacuum. They wanted the ability to test at low and high temperatures (-60 C to ...
May 28, 2019Success Story - Semiautomatic Optoelectronics Wafer Test System - Light Emitting Diodes
The customer wanted a semiautomatic probe system to test light emitting diodes (LEDS) in a few different modes - wafer form, wafers sawn and stretched on frames ...
May 20, 2019Success Story - Optoelectronics Wafer Test System - VCSELS EELDS
The customer wanted a multipurpose semiautomatic probe system to test vertical-cavity surface-emitting laser diodes (VCSELS) and edge-emitting laser diodes ...
May 20, 2019Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System
The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...
May 13, 2019Success Story - Double - Sided Optoelectronics Wafer Test System
The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...
May 13, 2019Success Story - Optoelectronics Fully Automated Wafer Prober- MEMS
Customer Requirements: The customer wanted a fully automatic probe system to test silicon photonic devices in wafer form that were manufactured using MEMS ...
May 13, 2019