Semiconductor Wafer Prober Testing & Prober Technology Insights

Success Story - Fully Automatic Double-Sided Optoelectronics Wafer Test System

The customer wanted a 300 mm fully automatic double-sided probe system for high volume silicon photonics testing in a production environment. The system had to ...

May 13, 2019

Success Story - Double - Sided Optoelectronics Wafer Test System

The customer wanted a manual double-sided probing (DSP) system to test silicon photonic chips and wafers using probe cards and manipulators. The top side of the ...

May 13, 2019

Success Story - Optoelectronics Fully Automated Wafer Prober- MEMS

Customer Requirements: The customer wanted a fully automatic probe system to test silicon photonic devices in wafer form that were manufactured using MEMS ...

May 13, 2019

Success Story - Double-sided Optoelectronics Semiautomatic Wafer Prober

Customer Requirements:...

May 13, 2019

Optoelectronic Wafer Prober VCSELS - Success Story

Customer Requirements:...

May 13, 2019

Success Story - Semiautomatic Vacuum Probing System- MEMS - China

Success Story – Vacuum Prober – China Customer Requirements:...

November 01, 2018

Success Story - Multi-Functional Wafer Probing Solution - MEMS, High Frequency & Optoelectronics

Success Story – Optoelectronics - Europe Custom Optoelectronic Test System - Vtt (Finland) Customer Requirements: Fully Automatic Electro-Optical probing system ...

August 28, 2018

Success Story - Bournes Automotive Sensor Testing System for Failure Analysis

Success Story-Mexico & USA Customer: Bourns De Mexico - http://www.bourns.com...

August 28, 2018

Success Story - Optoelectronics Double Sided Probing System

Success Story – Europe Optoelectronic Probe System with Thorlabs Multi-Axis Programmable Manipulators Customer Requirements: Manual Double Sided Probing System ...

August 28, 2018

Success Story - Magnetic Stimulation Wafer Characterization Probing System

Success Story - USA When a major University research center called for the unique ability to hold and control a magnetic source within 2 mm of the bottom of their ...

August 28, 2018
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